The International Center for Art Intelligence Inc.,© began in 1998 at the conference "Scientific Detection of Fakery in Art" (SPIE - The International Society for Optical Engineering), 29-30 January 1998, San Jose, California. This symposium brought together scientists, art historians and collectors to begin to confront some of the difficult issues surrounding art authentication and fakery. There was a clear resolution among group members that an association of interested professionals could make a difference in terms of offering professional, objective, and scientifically unassailable support for art authentication.