Walter McCrone, Duane R. Chartier, and Richard Weiss (Chairs/Editors). Scientific Detection of Fakery in Art. Proceedings of SPIE (SPIE - The International Society for Optical Engineering). 29-30 January 1998, San Jose, California. Volume P 3315. Bellingham, WA: SPIE, 1998.

Duane Chartier and Fred Notehelfer. "Authentication: Science and Art at Odds?" (Invited paper). In Scientific Detection of Fakery in Art. Proceedings of SPIE (SPIE - The International Society for Optical Engineering). 29-30 January 1998, San Jose, California. Volume P 3315, 74-86, 1998.